![ZEISS MMZ M ZEISS MMZ M]({"xsmall":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/cmm/large-cmms/mmz-m/zeiss-mmz-m-product-image.jpg/_jcr_content/renditions/original.image_file.100.100.36,0,1964,1928.file/zeiss-mmz-m-product-image.jpg","small":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/cmm/large-cmms/mmz-m/zeiss-mmz-m-product-image.jpg/_jcr_content/renditions/original.image_file.360.360.36,0,1964,1928.file/zeiss-mmz-m-product-image.jpg","medium":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/cmm/large-cmms/mmz-m/zeiss-mmz-m-product-image.jpg/_jcr_content/renditions/original.image_file.768.768.36,0,1964,1928.file/zeiss-mmz-m-product-image.jpg","large":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/cmm/large-cmms/mmz-m/zeiss-mmz-m-product-image.jpg/_jcr_content/renditions/original.image_file.1024.1024.36,0,1964,1928.file/zeiss-mmz-m-product-image.jpg","xlarge":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/cmm/large-cmms/mmz-m/zeiss-mmz-m-product-image.jpg/_jcr_content/renditions/original.image_file.1280.1280.36,0,1964,1928.file/zeiss-mmz-m-product-image.jpg","xxlarge":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/cmm/large-cmms/mmz-m/zeiss-mmz-m-product-image.jpg/_jcr_content/renditions/original.image_file.1440.1440.36,0,1964,1928.file/zeiss-mmz-m-product-image.jpg","max":"https://www.zeiss.com.sg/content/dam/iqs/r/systems/cmm/large-cmms/mmz-m/zeiss-mmz-m-product-image.jpg/_jcr_content/renditions/original.image_file.1920.1920.36,0,1964,1928.file/zeiss-mmz-m-product-image.jpg"})
ZEISS MMZ M
Bridge-type CMM for complex workpieces
ZEISS MMZ M offers a solution for the most demanding precision requirements. The machine is ideal for checking complex workpieces, especially those with tight tolerances. The stable bridge design enables an exceptional scanning performance.
Technical Data for ZEISS MMZ M
|
|
|
---|---|---|
Length measurement error |
MPE_E150 |
from 2.2 + L/400 μm |
Single stylus probing error |
MPE_PFTU |
from 1,7 μ |
Scanning probing error |
MPE_THP/tau |
from 2.2 μ / 64 s |
Form measuring error |
MPE RONt |
from 2.0 μm |
Contact us
Interested in exploring our products or services further? We're excited to offer you more details or a live demo, either remotely or in person.
ZEISS Metrology Shop
Easily order probes, measurement accessories, and more