
ZEISS MMZ M
Bridge-type CMM for complex workpieces
ZEISS MMZ M offers a solution for the most demanding precision requirements. The machine is ideal for checking complex workpieces, especially those with tight tolerances. The stable bridge design enables an exceptional scanning performance.
Technical Data for ZEISS MMZ M
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Length measurement error |
MPE_E150 |
from 2.2 + L/400 μm |
Single stylus probing error |
MPE_PFTU |
from 1,7 μ |
Scanning probing error |
MPE_THP/tau |
from 2.2 μ / 64 s |
Form measuring error |
MPE RONt |
from 2.0 μm |
Schedule a demo at a ZEISS Quality Excellence Center near you
ZEISS Quality Excellence Centers in Southeast Asia provide hands-on access to the latest metrology solutions, including CMMs, 2D X-ray systems, 3D X-ray (computed tomography - CT) systems, light microscopes, digital microscopes, scanning electron microscopes and optical 3D scanners. Whether you need a live demo with your own parts or expert measurement services, our specialists are ready to support your quality assurance needs.
We have ZEISS Quality Excellence Centers in Malaysia, Thailand and Vietnam. We can also support your demo, training, measurement and inspection needs in Singapore, Indonesia and Philippines at our partners' sites.