
ZEISS VAST XXT
Scanning probe for highly precise measurements
The ZEISS VAST XXT tactile scanning probe enables precise scanning with the ZEISS RDS articulating system and is suitable for a wide range of applications.
Features

Flexible use for a wide range of applications
There are numerous cases where users would like to combine the flexibility of an articulating system with scanning capability. ZEISS VAST XXT is ideal for such tasks.
Compared to switching probes, ZEISS VAST XXT increases the operational reliability and accuracy of the measurements, but also expands the measurement pallet to include scanning functionality and thus provides information on the form of the features.

Compact design
The compact and lightweight design of the scanning probes on the articulating system requires different probe modules. With three modules, ZEISS VAST XXT covers the typical stylus length range for this probe design.
This sensor accepts lateral styli up to 65 millimeters It is also suitable for permanent installation.
Schedule a demo at a ZEISS Quality Excellence Center near you
ZEISS Quality Excellence Centers in Southeast Asia provide hands-on access to the latest metrology solutions, including CMMs, 2D X-ray systems, 3D X-ray (computed tomography - CT) systems, light microscopes, digital microscopes, scanning electron microscopes and optical 3D scanners. Whether you need a live demo with your own parts or expert measurement services, our specialists are ready to support your quality assurance needs.
We have ZEISS Quality Excellence Centers in Malaysia, Thailand and Vietnam. We can also support your demo, training, measurement and inspection needs in Singapore, Indonesia and Philippines at our partners' sites.